Machine Vision Metrology
Machine vision is a key component in the ever increasing automation worldwide and is therefore also often referred to as the "eye of Industry 4.0". Although not always obvious, machine vision is ubiquitous today: It can be assumed, for example, that every manufactured smartphone has been extensively inspected with machine vision. This development was recently fuelled by the use of increasingly powerful graphics cards, which opened up new areas of application, especially in the field of machine learning, and by the emergence of industrial 3D sensors, which led to the increased use of 3D machine vision, especially in robotics.
Research in the field of machine vision is strongly influenced by influences from the fields of computer vision, machine learning, photogrammetry, and robotics. Important technology drivers, especially for machine learning, are currently automotive engineering, communication and consumer electronics, medicine, and logistics. As a result, the research landscape has recently undergone major changes: Cutting-edge research in the fields of computer vision and machine learning is not only carried out at universities and research institutes, but increasingly also by large tech companies, whose immense research budgets make them attractive employers for young academics.
Machine Vision Metrology can benefit from these developments at the interface between research, innovation, and application and at the same time make important contributions. In particular, the development of precise and accurate methods, such as the measurement or localization of electronic components during the manufacturing process, can be considered a core competence. The research objective is not only to develop scientific methods in an industrial context. It is also the aim to observe research results from neighbouring disciplines, to illuminate them against a geodetic background, and make them accessible to Machine Vision Metrology, and to communicate them to graduates in the course of research-oriented teaching.
Portrait | Titel Name | Kombi: Kontakt |
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Prof. Dr.-Ing. Ulrich, Markus | +49 721 608-47410 markus ulrich ∂ kit edu CS 20.40 030 |
Portrait | Titel Name | Kombi: Kontakt |
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Haitz, Dennis, M.Sc. | dennis haitz ∂ kit edu |
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MSc. Rudolph, Jan Andre | +49 721 608-42316 +49 721 608-45051 +49 176 26051142 jan rudolph ∂ kit edu CS 20.40 030, (-121) |
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Wursthorn, Kira, M.Sc. | kira wursthorn ∂ kit edu CS 20.40 029a |
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Dr.-Ing. Hillemann, Markus | markus hillemann ∂ kit edu CS 20.40 029/1 |
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Hong, Shuwei, M.Sc. | shuwei hong ∂ kit edu CS 20.40 029.1 |
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Landgraf, Steven, M.Sc. | +49 721 608-44130 steven landgraf ∂ kit edu CS 20.40 029.1 |
Publications
Ulrich, M.; Steger, C.; Butsch, F.; Liebe, M.
2024. ISPRS Journal of Photogrammetry and Remote Sensing, 218 (Part A), 645–662. doi:10.1016/j.isprsjprs.2024.09.037
Krüger, S.; Wursthorn, K.; Jäger, M. A.; Rabold, J.; Mayer, M.
2024. Mitteilungen und Veröffentlichungen aus den Themenbereichen Geodäsie, Geoinformation und Landmanagement, 72 (2), 68–71
Jäger, M.; Kapler, T.; Feßenbecker, M.; Birkelbach, F.; Hillemann, M.; Jutzi, B.
2024. The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences, XLVIII-2-2024, 159 – 166. doi:10.5194/isprs-archives-XLVIII-2-2024-159-2024
Wursthorn, K.; Hillemann, M.; Ulrich, M.
2024. ISPRS Annals of the Photogrammetry, Remote Sensing and Spatial Information Sciences, X-2-2024, 223–230. doi:10.5194/isprs-annals-X-2-2024-223-2024
Hillemann, M.; Langendörfer, R.; Heiken, M.; Mehltretter, M.; Schenk, A.; Weinmann, M.; Hinz, S.; Heipke, C.; Ulrich, M.
2024. arxiv. doi:10.48550/arXiv.2405.04345
Landgraf, S.; Wursthorn, K.; Hillemann, M.; Ulrich, M.
2024. PFG – Journal of Photogrammetry, Remote Sensing and Geoinformation Science, 92 (2), 101–114. doi:10.1007/s41064-024-00280-4
Jäger, M.; Kapler, T.; Feßenbecker, M.; Birkelbach, F.; Hillemann, M.; Jutzi, B.
2024. doi:10.48550/arXiv.2405.02005
Hillemann, M.; Langendörfer, R.; Heiken, M.; Mehltretter, M.; Schenk, A.; Weinmann, M.; Hinz, S.; Heipke, C.; Ulrich, M.
2024. The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences, XLVIII-2-2024, 137–144. doi:10.5194/isprs-archives-XLVIII-2-2024-137-2024
Landgraf, S.; Hillemann, M.; Wursthorn, K.; Ulrich, M.
2024. ISPRS Annals of the Photogrammetry, Remote Sensing and Spatial Information Sciences, X-2-2024, 129–136. doi:10.5194/isprs-annals-X-2-2024-129-2024
Krüger, S.; Wursthorn, K.; Jäger, M. A.; Rabold, J.; Mayer, M.
2024. Mitteilungen und Veröffentlichungen aus den Themenbereichen Geodäsie, Geoinformation und Landmanagement, 72 (1), 50–54
Landgraf, S.; Hillemann, M.; Kapler, T.; Ulrich, M.
2024. arxiv. doi:10.48550/arXiv.2402.10580
Michel, C.; Keller, S.
2024. IEEE Geoscience and Remote Sensing Letters, 21, Art.-Nr.: 3501005. doi:10.1109/LGRS.2023.3343076
Ulrich, M.; Hillemann, M.
2024. IEEE Transactions on Robotics, 40, 573–591. doi:10.1109/TRO.2023.3330609
Wolf, D. W.; Ulrich, M.; Kapoor, N.
2023. 2023 IEEE/CVF International Conference on Computer Vision Workshops (ICCVW), Paris, 25th December 2023, 4102–4111, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICCVW60793.2023.00443
Wolf, D. W.; Ulrich, M.; Braun, A.
2023. Metrologia, 60 (6), Article no: 064001. doi:10.1088/1681-7575/acf1a4
Werner Wolf, D.; Ulrich, M.; Braun, A.
2023. 2023 IEEE 26th International Conference on Intelligent Transportation Systems (ITSC), 5190–5197, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ITSC57777.2023.10421970
Zhou, B.; Klein, J.-F.; Wang, B.; Hillemann, M.
2023. 2023 IEEE 19th International Conference on Automation Science and Engineering (CASE), Auckland, New Zealand, 26-30 August 2023, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CASE56687.2023.10260623
Haitz, D.; Hübner, P.; Ulrich, M.; Jutzi, B.
2023. tm - Technisches Messen, 90 (7-8), 522–532. doi:10.1515/teme-2023-0009
Jäger, M. A.; Ketzer, D.; Krüger, S.; Mayer, M.; Rabold, J.; Stay, A.; Wursthorn, K.
2023, June 29. 4. DVW-BW NachwuchsForum (2023), Karlsruhe, Germany, June 29, 2023
Landgraf, S.; Hillemann, M.; Ulrich, M.; Aberle, M.; Jung, V.
2023, June 20. doi:10.5445/IR/1000159497
Michel, C. E.
2023, May 17. Karlsruher Institut für Technologie (KIT). doi:10.5445/IR/1000158805
Wolf, D. W.; Ulrich, M.; Braun, A.
2023. arxiv. doi:10.48550/arXiv.2305.14513
Gentes, S.; Barretto, T.; Hinz, S.; Haitz, D.
2023. Bundesministerium für Bildung und Forschung (BMBF)
Gentes, S.; Barretto, T.; Hinz, S.; Haitz, D.
2023. Technische Informationsbibliothek (TIB)
Landgraf, S.; Hillemann, M.; Wursthorn, K.; Ulrich, M.
2023. arxiv. doi:10.48550/arXiv.2307.09947
Landgraf, S.; Hillemann, M.; Aberle, M.; Jung, V.; Ulrich, M.
2023. ISPRS Annals of the Photogrammetry, Remote Sensing and Spatial Information Sciences, X-1/W1-2023, 953–960. doi:10.5194/isprs-annals-X-1-W1-2023-953-2023
Petrovska, I.; Jäger, M.; Haitz, D.; Jutzi, B.
2023. The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences, XLVIII-1/W3-2023, 153–159. doi:10.5194/isprs-archives-XLVIII-1-W3-2023-153-2023
Wolf, D. W.; Ulrich, M.; Kapoor, N.
2023. doi:10.5445/IR/1000162967
Haitz, D.; Jutzi, B.; Ulrich, M.; Jäger, M.; Hübner, P.
2023. The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences, XLVIII-1/W1-2023, 167 – 174. doi:10.5194/isprs-archives-XLVIII-1-W1-2023-167-2023
Landgraf, S.; Hillemann, M.; Aberle, M.; Jung, V.; Ulrich, M.
2023. doi:10.5445/IR/1000159876
Landgraf, S.; Wursthorn, K.; Hillemann, M.; Ulrich, M.
2023
Haitz, D.; Jutzi, B.; Ulrich, M.; Jäger, M.; Huebner, P.
2023. arxiv. doi:10.48550/arXiv.2304.14301
Jäger, M.; Hübner, P.; Haitz, D.; Jutzi, B.
2023. The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences, XLVIII-1/W1-2023, 207–213. doi:10.5194/isprs-archives-XLVIII-1-W1-2023-207-2023
Katona, M.
2022, December 7. Karlsruher Institut für Technologie (KIT). doi:10.5445/IR/1000153462
Schill, F.; Michel, C.; Firus, A.
2022. Sensors, 22 (23), Art.-Nr.: 9562. doi:10.3390/s22239562
Wursthorn, K.; Hillemann, M.; Ulrich, M.
2022. doi:10.5445/IR/1000150338
Jahn, M. W.
2022, August 29. Karlsruher Institut für Technologie (KIT). doi:10.5445/IR/1000150143
Haitz, D.; Hübner, P.; Ulrich, M.; Landgraf, S.; Jutzi, B.
2022. Forum Bildverarbeitung 2022. Ed.: T. Längle; M. Heizmann, 73–85, KIT Scientific Publishing
Haitz, D.; Jutzi, B.; Hübner, P.; Ulrich, M.
2022. The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences, XLIII-B1-2022, 143–150. doi:10.5194/isprs-archives-XLIII-B1-2022-143-2022
Landgraf, S.; Kühnlein, L.; Hillemann, M.; Hoyer, M.; Keller, S.; Ulrich, M.
2022. The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences, XLIII-B2-2022, 601–607. doi:10.5194/isprs-archives-XLIII-B2-2022-601-2022
Wursthorn, K.; Hillemann, M.; Ulrich, M.
2022. The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences, XLIII-B2-2022, 721–728. doi:10.5194/isprs-archives-XLIII-B2-2022-721-2022
Michel, C.; Keller, S.
2022. Applied Sciences, 12 (11), Artk.Nr.: 5354. doi:10.3390/app12115354
Bertels, M.; Jutzi, B.; Ulrich, M.
2022. Sensors, 22 (7), 2627. doi:10.3390/s22072627
Heizmann, M.; Braun, A.; Glitzner, M.; Günther, M.; Hasna, G.; Klüver, C.; Krooß, J.; Marquardt, E.; Overdick, M.; Ulrich, M.
2022. Automatisierungstechnik, 70 (1), 90–101. doi:10.1515/auto-2021-0149
Steger, C.; Ulrich, M.
2022. Journal of Mathematical Imaging and Vision, 64, 105–130. doi:10.1007/s10851-021-01055-x
Dalheimer, L.; Fuge, R.; Gschwind, C.; Juretzko, M.; Landgraf, S.; Meid, F.; Naab, C.; Ulrich, M.; Weisgerber, J.
2021. doi:10.5445/IR/1000137359
Ulrich, M.; Hillemann, M.
2021. IEEE International Conference on Robotics and Automation (ICRA), 30 May-5 June 2021, 11060–11066, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICRA48506.2021.9560823
Michel, C.; Keller, S.
2021. 13th European Conference on Synthetic Aperture Radar, EUSAR 2021: Online ; 29 March 2021 through 1 April 2021, 1073–1077, Institute of Electrical and Electronics Engineers (IEEE)
Michel, C.; Keller, S.
2021. Sensors, 21 (6), 2172. doi:10.3390/s21062172
Steger, C.; Ulrich, M.
2021. International journal of computer vision, 129, 80–99. doi:10.1007/s11263-020-01358-3
Hillemann, M.
2020, November 2. Karlsruher Institut für Technologie (KIT). doi:10.5445/IR/1000125412
Heizmann, M.; Braun, A.; Hüttel, M.; Klüver, C.; Marquardt, E.; Overdick, M.; Ulrich, M.
2020. Automatisierungstechnik, 68 (6), 477–487. doi:10.1515/auto-2020-0006
Keller, S.; Michel, C.; Schneider, O.; Müller, J.; Arnold, M.; Döring, A.; Hoyer, M.; Hinz, S.; Keller, H. B.
2020. Brückenbau, (3), 22–29
Ulrich, M.; Follmann, P.; Neudeck, J.-H.
2019. Technisches Messen, 86 (11), 685–698. doi:10.1515/teme-2019-0076
Ulrich, M.; Steger, C.
2019. Machine vision and applications, 30 (6), 1013–1028. doi:10.1007/s00138-019-01032-w
Hillemann, M.; Meidow, J.; Jutzi, B.
2019. The international archives of photogrammetry, remote sensing and spatial information sciences, XLII-2/W16, 119–125. doi:10.5194/isprs-archives-XLII-2-W16-119-2019
Hillemann, M.; Weinmann, M.; Mueller, M. S.; Jutzi, B.
2019. Remote sensing, 11 (16), Article: 1955. doi:10.3390/rs11161955
Hübner, P.; Landgraf, S.; Weinmann, M.; Wursthorn, S.
2019. 39. Wissenschaftlich-Technische Jahrestagung der DGPF - Dreiländertagung OVG – DGPF – SGPF - Photogrammetrie - Fernerkundung - Geoinformation, Wien, 20 - 22. Februar 2019. Ed. T. B. Kersten, 44–53, Deutsche Gesellschaft für Photogrammetrie
Steger, C.; Ulrich, M.; Wiedemann, C.
2018. Wiley-VCH Verlag
Follmann, P.; Böttger, T.; Härtinger, P.; König, R.; Ulrich, M.
2018. Computer Vision – ECCV 2018. Ed.: V. Ferrari, 581–597, Springer. doi:10.1007/978-3-030-01249-6_35
Hübner, P.; Weinmann, M.; Hillemann, M.; Jutzi, B.; Wursthorn, S.
2018. 2018 ISPRS TC II Mid-term Symposium “Towards Photogrammetry 2020”, 455–462, International Society for Photogrammetry and Remote Sensing (ISPRS). doi:10.5194/isprs-archives-XLII-2-455-2018
Böttger, T.; Ulrich, M.; Steger, C.
2017. Image Analysis. Part 1. Ed.: P. Sharma, 54–65, Springer-Verlag. doi:10.1007/978-3-319-59126-1_5
Drost, B.; Ulrich, M.; Bergmann, P.; Härtinger, P.; Steger, C.
2017. 2017 IEEE International Conference on Computer Vision Workshops (ICCVW), 2200–2208, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICCVW.2017.257
Hillemann, M.; Jutzi, B.
2017. 4th ISPRS Annals of Photogrammetry, Remote Sensing and Spatial Information Sciences - International Conference on Unmanned Aerial Vehicles in Geomatics, Bonn, Germany, 4.-7. September 2017. Ed.: C. Stachniss. Vol. IV-2/W3., 49–57, ISPRS. doi:10.5194/isprs-annals-IV-2-W3-17-2017
Weinmann, M.; Müller, M. S.; Hillemann, M.; Reydel, N.; Hinz, S.; Jutzi, B.
2017. 4th ISPRS International Conference on Unmanned Aerial Vehicles in Geomatics, Bonn, Germany, 4th - 7th September 2017, 399–406, International Society for Photogrammetry and Remote Sensing (ISPRS). doi:10.5194/isprs-archives-XLII-2-W6-399-2017
Ulrich, M.
2017. Karlsruher Institut für Technologie (KIT)
Haraké, L.; Schilling, H.; Blohm, C.; Hillemann, M.; Lenz, A.; Becker, M.; Keskin, G.; Middelmann, W.
2016. Electro-Optical and Infrared Systems: Technology and Applications XIII, SPIE Security + Defence, 2016, Edinburgh, United Kingdom, 26-29 September 2016. Ed.: D. A. Huckridge, 998709, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2241051
Ulrich, M.; Steger, C.
2016. Pattern recognition and image analysis, 16 (1), 231–239. doi:10.1134/S1054661816010272
Böttger, T.; Ulrich, M.
2016. Pattern recognition and image analysis, 26 (1), 88–94. doi:10.1134/S1054661816010053
Böttger, T.; Ulrich, M.
2015. Proceedings of the OGRW 2014. Ed.: P. Dietrich, 205–210, University of Koblenz-Landau
Ulrich, M.; Heider, A.; Steger, C.
2015. Proceedings of the OGRW2014. 9th Open German-Russian Workshop on Pattern Recognition and Image Understanding. Ed.: D. Paulus, 117–122, University of Koblenz-Landau
Ulrich, M.; Wiedemann, C.; Steger, C.
2012. IEEE transactions on pattern analysis and machine intelligence, 34 (10), 1902–1914. doi:10.1109/TPAMI.2011.266
Steger, C.; Ulrich, M.; Wiedemann, C.
2011. Photon-Tech Instruments Co
Burkert, F.; Butenuth, M.; Ulrich, M.
2011. The photogrammetric record, 26 (134), 154–170. doi:10.1111/j.1477-9730.2011.00633.x
Drost, B.; Ulrich, M.; Navab, N.; Ilic, S.
2010. 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR), 998–1005, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPR.2010.5540108
Frey, D.; Ulrich, M.; Hinz, S.
2010. Photogrammetrie - Fernerkundung - Geoinformation, 10 (1), 5–16. doi:10.1127/1432-8364/2010/0036
Ulrich, M.; Wiedemann, C.; Steger, C.
2009. IEEE International Conference on Robotics and Automation, 1191–1198, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ROBOT.2009.5152511
Steger, C.; Ulrich, M.; Wiedemann, C.
2008. LinX Corporation
Steger, C.; Ulrich, M.; Wiedemann, C.
2008. Tsinghua University Press
Wiedemann, C.; Ulrich, M.; Steger, C.
2008. Pattern Recognition. Ed.: G. Rigoll, 132–141, Springer-Verlag. doi:10.1007/978-3-540-69321-5_14
Steger, C.; Ulrich, M.; Wiedemann, C.
2007. Wiley-VCH Verlag
Ulrich, M.; Steger, C.; Baumgartner, A.; Ebner, H.
2004. Commemorative Volume for the 60th Birthday of Prof. Dr. Armin Grün, ETH Zürich, 251–259, Institute of Geodesy and Photogrammetry
Ulrich, M.; Steger, C.; Baumgartner, A.; Ebner, H.
2004. ZfV, 129 (3), 184–194
Ulrich, M.
2003. Verlag der Bayerischen Akademie der Wissenschaften in Kommission beim Verlag C.H. Beck
Ulrich, M.; Steger, C.; Baumgartner, A.
2003. Pattern recognition, 36 (11), 2557–2570. doi:10.1016/S0031-3203(03)00169-9
Ulrich, M.; Steger, C.
2002. Empirical Evaluation Methods in Computer Vision. Ed.: H.I. Christensen, 62–76, World Scientific Publishing
Ulrich, M.; Steger, C.
2002. Technische Universität München (TUM)
Ulrich, M.; Baumgartner, A.; Steger, C.
2002. The international archives of photogrammetry, remote sensing and spatial information sciences, XXXIV-5/WGV/1, 99–104
Ulrich, M.; Steger, C.
2002. Proceedings of the ISPRS Commission III Symposium Photogrammetric Computer Vision, 368–374
Schuh, H.; Ulrich, M.; Egger, D.; Müller, J.; Schwegmann, W.
2002. Vorträge beim 4. DFG-Rundgespräch im Rahmen des Forschungsvorhabens Rotation der Erde zum Thema ’Wechselwirkungen im System Erde’. Ed.: H. Schuh, 87–89, Verlag der Bayerischen Akademie der Wissenschaften
Schuh, H.; Ulrich, M.; Egger, D.; Müller, J.; Schwegmann, W.
2002. Journal of geodesy, 76 (5), 247–258. doi:10.1007/s00190-001-0242-5
Schuh, H.; Ulrich, M.
2001. Journées Systèmes de Référence Spatio-Temporels : Paris, France, 18 - 20 Septembre 2000 ; J2000, une époque fondamentale pour les origines des systèmes de référence. [J2000, a fundamental epoch for origins of reference systems and astronomical models]. Ed.: N. Capitaine, 302–303, Observatoire de Paris
Ulrich, M.; Steger, C.; Baumgartner, A.; Ebner, H.
2001. Technische Universität München (TUM)
Ulrich, M.; Steger, C.; Baumgartner, A.; Ebner, H.
2001. Photogrammetrie - Fernerkundung - Geoinformation: Geodaten schaffen Verbindungen. Hrsg.: E. Seyfert, 571–578, DGPF
Koshimizu, H.; Ishii, A.; Suga, Y.; Kaneko, S.; Hara, Y.; Murakami, K.; Umeda, K.; Murakami, N.; Tsujitani, J.; Bushimata, S.; Hirata, A.; Adachi, T.; Eckstein, W.; Steger, C.; Lückenhaus, M.; Ulrich, M.; Blahusch, G.
2001. LinX Corporation
Ulrich, M.; Steger, C.; Baumgartner, A.; Ebner, H.
2001. Optical 3-D Measurement Techniques V. Ed.: A. Grün, 308–318, Vienna University of Technology